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Nanometric Thin Films : Formation, Interfaces and Defects
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66
Keywords
Ion implantation
Photoluminescence
Indium oxide
8140Ef
XRD
Assessment
Charge exchange
Auger Electron Spectroscopy AES
Silicon Carbide
Zinc oxide
Alloy
Silica
Al2O3
Diffusion
Channeling
ADSORPTION DESORPTION HYSTERESIS
Silicon carbide
EPR
Ferromagnetic resonance
Low energy electron diffraction LEED
Amorphous silicon nanoparticles
Magnetization curves
Analyse par faisceaux d'ions
AFM
Nanoparticles
Amorphous carbon
Nuclear reaction analysis
Pulsed laser deposition
Magnetic semiconductors
Hysteresis
ALD
Capillary condensation
Atomic force microscopy AFM
Applied physics
Gallium oxide
Ageing
Raman spectroscopy
Kossel diffraction
7630Lh
7550Pp
Topological insulators
6855Jk
Atomic Structure
Periodic multilayer
Measurement
7550Ee
Sputtering
Nuclear resonance profiling NRP
Evaluation
PIXE
Nanostructures
Interface defects
Epitaxial growth
X-ray diffraction
GaMnAs
Density functional theory
SiC
Pb centers
Growth
17O
Metal-insulator transition
15N
Stable isotopic tracing
Acoustic
Aluminum
Rutherford backscattering spectrometry RBS
Adsorbed layers
Thin films
RBS
Transparent conductive oxide TCO
Acoustic propreties of solid
Alloys
Multilayer
Anatase
Energy loss
Silicon
3C-SiC
XPS
Nickel
Annealing
18O resonance
2H
Adsorption
Anodizing
AC susceptibility
Ion beam analysis
Magnetic anisotropy
Oxygen deficiency
Auger electron spectroscopy AES
Epitaxy
13C
Oxidation
Atomic transport
Atomic Layer Deposition ALD
Aluminium
Artificial superlattices
NRP
Nitridation
Passivation
18O