Ageing Ferromagnetic resonance Annealing Acoustic Nuclear resonance profiling NRP Evaluation Rutherford backscattering spectrometry RBS 8140Ef Sputtering Kossel diffraction Atomic Structure Indium oxide Stable isotopic tracing Silicon Carbide Magnetization curves Nitridation Diffusion Photoluminescence Nuclear reaction analysis Charge exchange 7550Pp Energy loss Ion implantation SiC Passivation 7550Ee Backscattering spectrometry Silicon carbide Nickel Metal-insulator transition Anatase Al2O3 Epitaxial growth Pb centers Epitaxy Thin films Growth 7630Lh 6855Jk Atomic force microscopy AFM Nanoparticles Aluminum ADSORPTION DESORPTION HYSTERESIS Measurement Auger Electron Spectroscopy AES Acoustic propreties of solid RBS Topological insulators Magnetic semiconductors Assessment ALD Ion beam analysis Low energy electron diffraction LEED Adsorbed layers Auger electron spectroscopy AES X-ray diffraction 2H Amorphous silicon nanoparticles Beta-silicon-carbide Density functional theory Atomic transport EPR Applied physics XPS Interface defects XRD Pulsed laser deposition Silica Aluminium 18O PIXE Channeling Adsorption Gallium oxide Raman spectroscopy NRP Anodizing Artificial superlattices Alloys AC susceptibility Periodic multilayer Nanostructures Alloy Transparent conductive oxide TCO 13C 15N Zinc oxide Analyse par faisceaux d'ions 17O Capillary condensation Oxidation 18O resonance 3C-SiC Oxygen deficiency AFM Amorphous carbon Hysteresis GaMnAs Magnetic anisotropy Silicon