Ion implantation Photoluminescence Indium oxide 8140Ef XRD Assessment Charge exchange Auger Electron Spectroscopy AES Silicon Carbide Zinc oxide Alloy Silica Al2O3 Diffusion Channeling ADSORPTION DESORPTION HYSTERESIS Silicon carbide EPR Ferromagnetic resonance Low energy electron diffraction LEED Amorphous silicon nanoparticles Magnetization curves Analyse par faisceaux d'ions AFM Nanoparticles Amorphous carbon Nuclear reaction analysis Pulsed laser deposition Magnetic semiconductors Hysteresis ALD Capillary condensation Atomic force microscopy AFM Applied physics Gallium oxide Ageing Raman spectroscopy Kossel diffraction 7630Lh 7550Pp Topological insulators 6855Jk Atomic Structure Periodic multilayer Measurement 7550Ee Sputtering Nuclear resonance profiling NRP Evaluation PIXE Nanostructures Interface defects Epitaxial growth X-ray diffraction GaMnAs Density functional theory SiC Pb centers Growth 17O Metal-insulator transition 15N Stable isotopic tracing Acoustic Aluminum Rutherford backscattering spectrometry RBS Adsorbed layers Thin films RBS Transparent conductive oxide TCO Acoustic propreties of solid Alloys Multilayer Anatase Energy loss Silicon 3C-SiC XPS Nickel Annealing 18O resonance 2H Adsorption Anodizing AC susceptibility Ion beam analysis Magnetic anisotropy Oxygen deficiency Auger electron spectroscopy AES Epitaxy 13C Oxidation Atomic transport Atomic Layer Deposition ALD Aluminium Artificial superlattices NRP Nitridation Passivation 18O